Hi all,
There are test pattern generation tools are commerically available.is there a way to generate test pattern for a JTAG support device with OpenOCD?
if we need to generate a test pattern with OpenOCD do we have to perform it manually? Help me on this im really interest on this OpenOCD and seeking to contribute this OpenOCD project.Thanks
Nuwan
You may try the Amontec JTAGkey bitstream console.
http://www.amontec.com/jtagkey.shtml#bitstream
it is free and you may download it and use -h to get the help.
With this console you may comes with a vector of patterns TMS_TDI_TDOEXPECTED described in a input .vec file.
TDOEXPECTED can be X 0 1.
The console will play the bitstream and check the TDO and write a TDO result file.
The result file can be created with fixed number of row or fixed number of column with a comma separator for an easy importation a view of you vector in Microsoft Excel.
The JTAGkey and JTAGkey-2 is now a new solution for ATE JTAG tests.
Or you may still use the Amontec JTAGkey SVF Player, if you test pattern is a SVF file.
Regards,
Laurent
Do we need to have JTAG Key adapter for this? can we use Xilinx Parallel cable IV for this software?Thanks
Amontec JTAGkey bitstream console is free and can be used with :
Amontec JTAGkey USB 2.0 full speed USB JTAG dongle 6Mhz
Amontec JTAGkey-2 USB 2.0 hi speed USB JTAG dongle 30Mhz
Amontec JTAGkey-2P USB 2.0 high speed USB JTAG dongl 30Mhz
Best regards,
Laurent