Hello !
since Open OCD claims to do boundary scan testing, this might be the place to introduce a similar open source project. It is about board and system testing by using the EXTEST and SAMPLE modes of ICs. Hardware manufacturing or system faults can be detected with it. Maybe there is a way to combine or integrate open OCD with System M-1. Please have a look at:
https://github.com/Blunk-electronic/M-1
I’m looking forward to any kind of feedback.
Cheers,
Mario Blunk